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Statistical Analysis of Random Telegraph Noises of MOSFET Subthreshold Currents Using a 1M Array Test Chip in a 40 nm Process
Research article (IEEE Journal of the Electron Devices Society, 2021) · cited 10× · AI/ML
Statistical Analysis of Random Telegraph Noises of MOSFET Subthreshold Currents Using a 1M Array Test Chip in a 40 nm Process
Summary
Statistical Analysis of Random Telegraph Noises of MOSFET Subthreshold Currents Using a 1M Array Test Chip in a 40 nm Process is a scholarly article[1].
Key Facts
Statistical Analysis of Random Telegraph Noises of MOSFET Subthreshold Currents Using a 1M Array Test Chip in a 40 nm Process's instance of is recorded as scholarly article[2].
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APA4ort.xyz Knowledge Graph. (2026). Statistical Analysis of Random Telegraph Noises of MOSFET Subthreshold Currents Using a 1M Array Test Chip in a 40 nm Process. Retrieved May 24, 2026, from https://4ort.xyz/entity/statistical-analysis-of-random-telegraph-noises-of-mosfet-subthreshold-currents-using-a-1m-array-test-chip-in-a-40-nm-pr
MLA“Statistical Analysis of Random Telegraph Noises of MOSFET Subthreshold Currents Using a 1M Array Test Chip in a 40 nm Process.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/statistical-analysis-of-random-telegraph-noises-of-mosfet-subthreshold-currents-using-a-1m-array-test-chip-in-a-40-nm-pr.
BibTeX@misc{4ortxyz_statistical-analysis-of-random-telegraph-noises-of-mosfet-subthreshold-currents-using-a-1m-array-test-chip-in-a-40-nm-pr_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Statistical Analysis of Random Telegraph Noises of MOSFET Subthreshold Currents Using a 1M Array Test Chip in a 40 nm Process}}, year = {2026}, url = {https://4ort.xyz/entity/statistical-analysis-of-random-telegraph-noises-of-mosfet-subthreshold-currents-using-a-1m-array-test-chip-in-a-40-nm-pr}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Statistical Analysis of Random Telegraph Noises of MOSFET Subthreshold Currents Using a 1M Array Test Chip in a 40 nm Process — https://4ort.xyz/entity/statistical-analysis-of-random-telegraph-noises-of-mosfet-subthreshold-currents-using-a-1m-array-test-chip-in-a-40-nm-pr (retrieved 2026-05-24)
