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Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs
Research article (IEEE Transactions on Electron Devices, 2022) · cited 10× · AI/ML
Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs
Summary
Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs is a scholarly article[1].
Key Facts
Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs's instance of is recorded as scholarly article[2].
References
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APA4ort.xyz Knowledge Graph. (2026). Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs. Retrieved May 24, 2026, from https://4ort.xyz/entity/refined-dc-and-low-frequency-noise-characterization-at-room-and-cryogenic-temperatures-of-vertically-stacked-silicon-nan
MLA“Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/refined-dc-and-low-frequency-noise-characterization-at-room-and-cryogenic-temperatures-of-vertically-stacked-silicon-nan.
BibTeX@misc{4ortxyz_refined-dc-and-low-frequency-noise-characterization-at-room-and-cryogenic-temperatures-of-vertically-stacked-silicon-nan_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs}}, year = {2026}, url = {https://4ort.xyz/entity/refined-dc-and-low-frequency-noise-characterization-at-room-and-cryogenic-temperatures-of-vertically-stacked-silicon-nan}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs — https://4ort.xyz/entity/refined-dc-and-low-frequency-noise-characterization-at-room-and-cryogenic-temperatures-of-vertically-stacked-silicon-nan (retrieved 2026-05-24)
