Low-frequency noise assessment of ferro-electric field-effect transistors with Si-doped HfO2 gate dielectric
Summary
Low-frequency noise assessment of ferro-electric field-effect transistors with Si-doped HfO2 gate dielectric is a scholarly article[1].
Key Facts
Low-frequency noise assessment of ferro-electric field-effect transistors with Si-doped HfO2 gate dielectric's instance of is recorded as scholarly article[2].
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APA4ort.xyz Knowledge Graph. (2026). Low-frequency noise assessment of ferro-electric field-effect transistors with Si-doped HfO2 gate dielectric. Retrieved May 24, 2026, from https://4ort.xyz/entity/low-frequency-noise-assessment-of-ferro-electric-field-effect-transistors-with-si-doped-hfo2-gate-dielectric
MLA“Low-frequency noise assessment of ferro-electric field-effect transistors with Si-doped HfO2 gate dielectric.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/low-frequency-noise-assessment-of-ferro-electric-field-effect-transistors-with-si-doped-hfo2-gate-dielectric.
BibTeX@misc{4ortxyz_low-frequency-noise-assessment-of-ferro-electric-field-effect-transistors-with-si-doped-hfo2-gate-dielectric_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Low-frequency noise assessment of ferro-electric field-effect transistors with Si-doped HfO2 gate dielectric}}, year = {2026}, url = {https://4ort.xyz/entity/low-frequency-noise-assessment-of-ferro-electric-field-effect-transistors-with-si-doped-hfo2-gate-dielectric}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Low-frequency noise assessment of ferro-electric field-effect transistors with Si-doped HfO2 gate dielectric — https://4ort.xyz/entity/low-frequency-noise-assessment-of-ferro-electric-field-effect-transistors-with-si-doped-hfo2-gate-dielectric (retrieved 2026-05-24)
