Ionizing Radiation Effects on the Noise of 65 nm CMOS Transistors for Pixel Sensor Readout at Extreme Total Dose Levels
Summary
Ionizing Radiation Effects on the Noise of 65 nm CMOS Transistors for Pixel Sensor Readout at Extreme Total Dose Levels is a scholarly article[1].
Key Facts
Ionizing Radiation Effects on the Noise of 65 nm CMOS Transistors for Pixel Sensor Readout at Extreme Total Dose Levels's instance of is recorded as scholarly article[2].
References
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APA4ort.xyz Knowledge Graph. (2026). Ionizing Radiation Effects on the Noise of 65 nm CMOS Transistors for Pixel Sensor Readout at Extreme Total Dose Levels. Retrieved May 24, 2026, from https://4ort.xyz/entity/ionizing-radiation-effects-on-the-noise-of-65-nm-cmos-transistors-for-pixel-sensor-readout-at-extreme-total-dose-levels
MLA“Ionizing Radiation Effects on the Noise of 65 nm CMOS Transistors for Pixel Sensor Readout at Extreme Total Dose Levels.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/ionizing-radiation-effects-on-the-noise-of-65-nm-cmos-transistors-for-pixel-sensor-readout-at-extreme-total-dose-levels.
BibTeX@misc{4ortxyz_ionizing-radiation-effects-on-the-noise-of-65-nm-cmos-transistors-for-pixel-sensor-readout-at-extreme-total-dose-levels_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Ionizing Radiation Effects on the Noise of 65 nm CMOS Transistors for Pixel Sensor Readout at Extreme Total Dose Levels}}, year = {2026}, url = {https://4ort.xyz/entity/ionizing-radiation-effects-on-the-noise-of-65-nm-cmos-transistors-for-pixel-sensor-readout-at-extreme-total-dose-levels}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Ionizing Radiation Effects on the Noise of 65 nm CMOS Transistors for Pixel Sensor Readout at Extreme Total Dose Levels — https://4ort.xyz/entity/ionizing-radiation-effects-on-the-noise-of-65-nm-cmos-transistors-for-pixel-sensor-readout-at-extreme-total-dose-levels (retrieved 2026-05-24)