Investigation of trap levels in HgCdTe IR detectors through low frequency noise spectroscopy

Research article (Semiconductor Science and Technology, 2016) · cited 21× · AI/ML
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Investigation of trap levels in HgCdTe IR detectors through low frequency noise spectroscopy

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Investigation of trap levels in HgCdTe IR detectors through low frequency noise spectroscopy is a scholarly article[1].

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  • Investigation of trap levels in HgCdTe IR detectors through low frequency noise spectroscopy's instance of is recorded as scholarly article[2].

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APA 4ort.xyz Knowledge Graph. (2026). Investigation of trap levels in HgCdTe IR detectors through low frequency noise spectroscopy. Retrieved May 24, 2026, from https://4ort.xyz/entity/investigation-of-trap-levels-in-hgcdte-ir-detectors-through-low-frequency-noise-spectroscopy
MLA “Investigation of trap levels in HgCdTe IR detectors through low frequency noise spectroscopy.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/investigation-of-trap-levels-in-hgcdte-ir-detectors-through-low-frequency-noise-spectroscopy.
BibTeX @misc{4ortxyz_investigation-of-trap-levels-in-hgcdte-ir-detectors-through-low-frequency-noise-spectroscopy_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Investigation of trap levels in HgCdTe IR detectors through low frequency noise spectroscopy}}, year = {2026}, url = {https://4ort.xyz/entity/investigation-of-trap-levels-in-hgcdte-ir-detectors-through-low-frequency-noise-spectroscopy}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Investigation of trap levels in HgCdTe IR detectors through low frequency noise spectroscopy — https://4ort.xyz/entity/investigation-of-trap-levels-in-hgcdte-ir-detectors-through-low-frequency-noise-spectroscopy (retrieved 2026-05-24)

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