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Experimental determination of the lateral resolution of surface electric potential measurements by Kelvin probe force microscopy using biased electrodes separated by a nanoscale gap and application to thin-film transistors

Research article (Nanoscale Advances, 2022) · cited 11× · AI/ML
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Experimental determination of the lateral resolution of surface electric potential measurements by Kelvin probe force microscopy using biased electrodes separated by a nanoscale gap and application to thin-film transistors

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Experimental determination of the lateral resolution of surface electric potential measurements by Kelvin probe force microscopy using biased electrodes separated by a nanoscale gap and application to thin-film transistors is a scholarly article[1].

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  • Experimental determination of the lateral resolution of surface electric potential measurements by Kelvin probe force microscopy using biased electrodes separated by a nanoscale gap and application to thin-film transistors's instance of is recorded as scholarly article[2].

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Direct Wikidata claims

  1. [2] ↑ . wikidata.org.

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  1. [1] ↑ . Wikidata. wikidata.org.

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APA 4ort.xyz Knowledge Graph. (2026). Experimental determination of the lateral resolution of surface electric potential measurements by Kelvin probe force microscopy using biased electrodes separated by a nanoscale gap and application to thin-film transistors. Retrieved May 24, 2026, from https://4ort.xyz/entity/experimental-determination-of-the-lateral-resolution-of-surface-electric-potential-measurements-by-kelvin-probe-force-mi
MLA “Experimental determination of the lateral resolution of surface electric potential measurements by Kelvin probe force microscopy using biased electrodes separated by a nanoscale gap and application to thin-film transistors.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/experimental-determination-of-the-lateral-resolution-of-surface-electric-potential-measurements-by-kelvin-probe-force-mi.
BibTeX @misc{4ortxyz_experimental-determination-of-the-lateral-resolution-of-surface-electric-potential-measurements-by-kelvin-probe-force-mi_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Experimental determination of the lateral resolution of surface electric potential measurements by Kelvin probe force microscopy using biased electrodes separated by a nanoscale gap and application to thin-film transistors}}, year = {2026}, url = {https://4ort.xyz/entity/experimental-determination-of-the-lateral-resolution-of-surface-electric-potential-measurements-by-kelvin-probe-force-mi}, note = {Accessed: 2026-05-24}}
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