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Experimental and theoretical verification of channel conductivity degradation due to grain boundaries and defects in 3D NAND
Research article (2017 IEEE International Electron Devices Meeting (IEDM), 2017) · cited 20× · AI/ML
Experimental and theoretical verification of channel conductivity degradation due to grain boundaries and defects in 3D NAND
Summary
Experimental and theoretical verification of channel conductivity degradation due to grain boundaries and defects in 3D NAND is a scholarly article[1].
Key Facts
Experimental and theoretical verification of channel conductivity degradation due to grain boundaries and defects in 3D NAND's instance of is recorded as scholarly article[2].
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APA4ort.xyz Knowledge Graph. (2026). Experimental and theoretical verification of channel conductivity degradation due to grain boundaries and defects in 3D NAND. Retrieved May 24, 2026, from https://4ort.xyz/entity/experimental-and-theoretical-verification-of-channel-conductivity-degradation-due-to-grain-boundaries-and-defects-in-3d-
MLA“Experimental and theoretical verification of channel conductivity degradation due to grain boundaries and defects in 3D NAND.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/experimental-and-theoretical-verification-of-channel-conductivity-degradation-due-to-grain-boundaries-and-defects-in-3d-.
BibTeX@misc{4ortxyz_experimental-and-theoretical-verification-of-channel-conductivity-degradation-due-to-grain-boundaries-and-defects-in-3d-_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Experimental and theoretical verification of channel conductivity degradation due to grain boundaries and defects in 3D NAND}}, year = {2026}, url = {https://4ort.xyz/entity/experimental-and-theoretical-verification-of-channel-conductivity-degradation-due-to-grain-boundaries-and-defects-in-3d-}, note = {Accessed: 2026-05-24}}
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