Home ›
Entities
› academia
› Evaluation of Positive-Bias-Stress-Induced Degradation in InSnZnO Thin-Film Transistors by Low Frequency Noise Measurement
Evaluation of Positive-Bias-Stress-Induced Degradation in InSnZnO Thin-Film Transistors by Low Frequency Noise Measurement
Research article (IEEE Electron Device Letters, 2022) · cited 36× · AI/ML
Evaluation of Positive-Bias-Stress-Induced Degradation in InSnZnO Thin-Film Transistors by Low Frequency Noise Measurement
Summary
Evaluation of Positive-Bias-Stress-Induced Degradation in InSnZnO Thin-Film Transistors by Low Frequency Noise Measurement is a scholarly article[1].
Key Facts
Evaluation of Positive-Bias-Stress-Induced Degradation in InSnZnO Thin-Film Transistors by Low Frequency Noise Measurement's instance of is recorded as scholarly article[2].
References
Programmatic citations — every numbered marker resolves to a verifiable graph row below.
Use these citations when quoting this entity in research, articles, AI prompts, or wherever provenance matters. We aggregate Wikidata + Wikipedia + authoritative open-data sources; the stitched, scored, cross-referenced view is what 4ort.xyz contributes.
APA4ort.xyz Knowledge Graph. (2026). Evaluation of Positive-Bias-Stress-Induced Degradation in InSnZnO Thin-Film Transistors by Low Frequency Noise Measurement. Retrieved May 24, 2026, from https://4ort.xyz/entity/evaluation-of-positive-bias-stress-induced-degradation-in-insnzno-thin-film-transistors-by-low-frequency-noise-measureme
MLA“Evaluation of Positive-Bias-Stress-Induced Degradation in InSnZnO Thin-Film Transistors by Low Frequency Noise Measurement.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/evaluation-of-positive-bias-stress-induced-degradation-in-insnzno-thin-film-transistors-by-low-frequency-noise-measureme.
BibTeX@misc{4ortxyz_evaluation-of-positive-bias-stress-induced-degradation-in-insnzno-thin-film-transistors-by-low-frequency-noise-measureme_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Evaluation of Positive-Bias-Stress-Induced Degradation in InSnZnO Thin-Film Transistors by Low Frequency Noise Measurement}}, year = {2026}, url = {https://4ort.xyz/entity/evaluation-of-positive-bias-stress-induced-degradation-in-insnzno-thin-film-transistors-by-low-frequency-noise-measureme}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Evaluation of Positive-Bias-Stress-Induced Degradation in InSnZnO Thin-Film Transistors by Low Frequency Noise Measurement — https://4ort.xyz/entity/evaluation-of-positive-bias-stress-induced-degradation-in-insnzno-thin-film-transistors-by-low-frequency-noise-measureme (retrieved 2026-05-24)
