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Degradation of InSnZnO Thin-Film Transistors Under Negative Bias Stress

Research article (IEEE Transactions on Electron Devices, 2023) · cited 14× · AI/ML
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Degradation of InSnZnO Thin-Film Transistors Under Negative Bias Stress

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Degradation of InSnZnO Thin-Film Transistors Under Negative Bias Stress is a scholarly article[1].

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  • Degradation of InSnZnO Thin-Film Transistors Under Negative Bias Stress's instance of is recorded as scholarly article[2].

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Direct Wikidata claims

  1. [2] ↑ . wikidata.org.

Class ancestry

  1. [1] ↑ . Wikidata. wikidata.org.

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APA 4ort.xyz Knowledge Graph. (2026). Degradation of InSnZnO Thin-Film Transistors Under Negative Bias Stress. Retrieved May 24, 2026, from https://4ort.xyz/entity/degradation-of-insnzno-thin-film-transistors-under-negative-bias-stress
MLA “Degradation of InSnZnO Thin-Film Transistors Under Negative Bias Stress.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/degradation-of-insnzno-thin-film-transistors-under-negative-bias-stress.
BibTeX @misc{4ortxyz_degradation-of-insnzno-thin-film-transistors-under-negative-bias-stress_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Degradation of InSnZnO Thin-Film Transistors Under Negative Bias Stress}}, year = {2026}, url = {https://4ort.xyz/entity/degradation-of-insnzno-thin-film-transistors-under-negative-bias-stress}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Degradation of InSnZnO Thin-Film Transistors Under Negative Bias Stress — https://4ort.xyz/entity/degradation-of-insnzno-thin-film-transistors-under-negative-bias-stress (retrieved 2026-05-24)

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