An Artificial Neural Network Model for Electro-Thermal Effect Affected Hot Carrier Injection Reliability in 14-nm FinFETs
Summary
An Artificial Neural Network Model for Electro-Thermal Effect Affected Hot Carrier Injection Reliability in 14-nm FinFETs is a scholarly article[1].
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An Artificial Neural Network Model for Electro-Thermal Effect Affected Hot Carrier Injection Reliability in 14-nm FinFETs's instance of is recorded as scholarly article[2].
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APA4ort.xyz Knowledge Graph. (2026). An Artificial Neural Network Model for Electro-Thermal Effect Affected Hot Carrier Injection Reliability in 14-nm FinFETs. Retrieved May 24, 2026, from https://4ort.xyz/entity/an-artificial-neural-network-model-for-electro-thermal-effect-affected-hot-carrier-injection-reliability-in-14-nm-finfet
MLA“An Artificial Neural Network Model for Electro-Thermal Effect Affected Hot Carrier Injection Reliability in 14-nm FinFETs.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/an-artificial-neural-network-model-for-electro-thermal-effect-affected-hot-carrier-injection-reliability-in-14-nm-finfet.
BibTeX@misc{4ortxyz_an-artificial-neural-network-model-for-electro-thermal-effect-affected-hot-carrier-injection-reliability-in-14-nm-finfet_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{An Artificial Neural Network Model for Electro-Thermal Effect Affected Hot Carrier Injection Reliability in 14-nm FinFETs}}, year = {2026}, url = {https://4ort.xyz/entity/an-artificial-neural-network-model-for-electro-thermal-effect-affected-hot-carrier-injection-reliability-in-14-nm-finfet}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): An Artificial Neural Network Model for Electro-Thermal Effect Affected Hot Carrier Injection Reliability in 14-nm FinFETs — https://4ort.xyz/entity/an-artificial-neural-network-model-for-electro-thermal-effect-affected-hot-carrier-injection-reliability-in-14-nm-finfet (retrieved 2026-05-24)
